Fdis


At-Speed and Advanced Fault Models for Achieving High Quality Test


With the increasing clock speeds and the decreasing feature sizes found in today's nanometer designs, at-speed testing is a requirement to achieve high quality test results. In addition, new advanced fault models are also available to improve defect detection and lower DPM rates. Advanced at-speed test capabilities and some new fault models are described in this paper.

{ 0 Reactions ... read them below or write one }

Post a Comment